发明申请
- 专利标题: Silicon film forming apparatus
- 专利标题(中): 硅膜形成装置
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申请号: US11519132申请日: 2006-09-12
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公开(公告)号: US20070007128A1公开(公告)日: 2007-01-11
- 发明人: Atsushi Tomyo , Eiji Takahashi , Masaki Fujiwara , Takashi Kotera , Masatoshi Onoda
- 申请人: Atsushi Tomyo , Eiji Takahashi , Masaki Fujiwara , Takashi Kotera , Masatoshi Onoda
- 专利权人: NISSIN ELECTRIC CO., LTD.
- 当前专利权人: NISSIN ELECTRIC CO., LTD.
- 优先权: JP2004-91888 20040326
- 主分类号: C23C14/00
- IPC分类号: C23C14/00 ; C23C16/00
摘要:
A silicon film forming apparatus includes a deposition chamber (10), a silicon sputter target (2) arranged in the chamber, a hydrogen gas supply circuit (102 or 102′) supplying a hydrogen gas into the chamber, and a high-frequency power applying device (antenna 1, 1′, power source PW and others) generating inductively coupled plasma by applying high-frequency power to the gas supplied into the deposition chamber (10). Chemical sputtering is effected on the target (2) by the plasma to form a silicon film on a substrate S. A silane gas may be used. A silane gas supply circuit (101) may be provided with a gas reservoir unit (GR). The silicon film can be formed inexpensively and fast at a relatively low temperature.
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