发明申请
- 专利标题: Systems and methods for tilt and range measurement
- 专利标题(中): 用于倾斜和量程测量的系统和方法
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申请号: US11175271申请日: 2005-07-07
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公开(公告)号: US20070008550A1公开(公告)日: 2007-01-11
- 发明人: Joseph Tobiason , David Sesko , Benjamin Jones , Michelle Milvich , Vidya Venkatachalam
- 申请人: Joseph Tobiason , David Sesko , Benjamin Jones , Michelle Milvich , Vidya Venkatachalam
- 申请人地址: JP Kawasaki
- 专利权人: MITUTOYO CORPORATION
- 当前专利权人: MITUTOYO CORPORATION
- 当前专利权人地址: JP Kawasaki
- 主分类号: G01B11/02
- IPC分类号: G01B11/02
摘要:
A method of determining an amount of tilt may include projecting at least two coherent wavefronts toward a target surface, the wavefronts reflecting from the target surface to create an interference fringe pattern on a detector, and transmitting a beam toward the target surface, the transmitted beam reflecting from the target surface to form a beam spot on the detector. A fringe pitch indicative of a distance to the target surface may be determined based on the interference fringe pattern. A displacement on the detector of the beam spot, relative to a nominal location of the beam spot when the target surface is at a nominal angle of incidence relative to the beam, may be determined. The amount of tilt of the target surface relative to the nominal angle of incidence, may be determined based on the displacement of the beam spot and the determined fringe pitch.
公开/授权文献
- US07433052B2 Systems and methods for tilt and range measurement 公开/授权日:2008-10-07
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