发明申请
- 专利标题: Framework that maximizes the usage of testhead resources in in-circuit test system
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申请号: US11183342申请日: 2005-07-18
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公开(公告)号: US20070013362A1公开(公告)日: 2007-01-18
- 发明人: Aik Loh , Roy Williams , Keen Fung Wai , Chen Low , Yi Jin , Rex Shang , Tiam Hock Tan , Daniel Whang
- 申请人: Aik Loh , Roy Williams , Keen Fung Wai , Chen Low , Yi Jin , Rex Shang , Tiam Hock Tan , Daniel Whang
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
A method and apparatus for maximizing the usage of a testhead of an in-circuit tester is presented. A testhead execution supervisor interfaces between a testhead controller and a graphical user interface used to enter manual tests. The testhead execution supervisor adds tests to be submitted to the testhead to one or more queues according to a priority scheme. Tests may be submitted to the testhead execution supervisor both as manual tests entered via the graphical user interface and as automatically generated tests generated by an automatic debug module. The automatic debug module may automatically generate tests for execution by the testhead that are executed when the testhead is idle, for example when no higher priority manual tests are scheduled.
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