公开(公告)号：US20070013362A1

公开(公告)日：2007-01-18

申请号：US11183342

申请日：2005-07-18

申请人： Aik Loh ,  Roy Williams ,  Keen Fung Wai ,  Chen Low ,  Yi Jin ,  Rex Shang ,  Tiam Hock Tan ,  Daniel Whang

发明人： Aik Loh ,  Roy Williams ,  Keen Fung Wai ,  Chen Low ,  Yi Jin ,  Rex Shang ,  Tiam Hock Tan ,  Daniel Whang

IPC分类号： G01R31/28

CPC分类号： G01R31/2886 ,  G01R31/2894 ,  G01R31/31705 ,  G01R31/31723

摘要： A method and apparatus for maximizing the usage of a testhead of an in-circuit tester is presented. A testhead execution supervisor interfaces between a testhead controller and a graphical user interface used to enter manual tests. The testhead execution supervisor adds tests to be submitted to the testhead to one or more queues according to a priority scheme. Tests may be submitted to the testhead execution supervisor both as manual tests entered via the graphical user interface and as automatically generated tests generated by an automatic debug module. The automatic debug module may automatically generate tests for execution by the testhead that are executed when the testhead is idle, for example when no higher priority manual tests are scheduled.

公开(公告)号：US07324982B2

公开(公告)日：2008-01-29

申请号：US10839955

申请日：2004-05-05

申请人： Aik Koon Loh ,  Keen Fung Wai ,  Tiam Hock Tan ,  Roy H. Williams

发明人： Aik Koon Loh ,  Keen Fung Wai ,  Tiam Hock Tan ,  Roy H. Williams

IPC分类号： G06F17/00 ,  G06F19/00 ,  G06F11/30 ,  G06F15/00 ,  G06F11/00 ,  G06N5/02 ,  G21C17/00 ,  G01R27/28 ,  G01R31/00 ,  G01R31/14 ,  G01R31/38 ,  G01R31/26

CPC分类号： G01R31/31835 ,  G06F11/2257

摘要： A method and apparatus for automatically debugging and optimizing an in-circuit test that is used to test a device under test on an automated tester is presented. The novel test debug and optimization technique extracts expert knowledge contained in a knowledge framework and automates the formulation of a valid stable, and preferably optimized, test for execution on an integrated circuit tester.

摘要翻译： 提出了一种用于自动调试和优化用于在自动测试仪上测试被测设备的在线测试的方法和装置。 新颖的测试调试和优化技术提取知识框架中包含的专家知识，并自动制定有效稳定且优化的集成电路测试仪执行测试。

公开(公告)号：US07089139B2

公开(公告)日：2006-08-08

申请号：US10919170

申请日：2004-08-16

申请人： Aik Koon Loh ,  Keen Fung Wai ,  Tiam Hock Tan ,  Roy H. Williams ,  Daniel Z. Whang ,  Chen Ni Low ,  Ellis Yuan

发明人： Aik Koon Loh ,  Keen Fung Wai ,  Tiam Hock Tan ,  Roy H. Williams ,  Daniel Z. Whang ,  Chen Ni Low ,  Ellis Yuan

IPC分类号： G06F7/02

CPC分类号： G01R31/2834 ,  G01R31/2843 ,  G01R31/2846

摘要： A method for configuring an automated in-circuit test debugger is presented. The novel test debug and optimization configuration technique configures expert knowledge into a knowledge framework for use by an automated test debug and optimization system for automating the formulation of a valid stable in-circuit test for execution on an integrated circuit tester. In a system that includes a rule-based controller for controlling interaction between the test-head controller of an integrated circuit tester and an automated debug system, the invention includes a knowledge framework and a rule-based editor. The knowledge framework stores test knowledge in the representation of rules that represent a debugging strategy. The rule-based editor facilitates the use of rules as knowledge to debug or optimize an in-circuit test that is to be executed on the integrated circuit tester.

摘要翻译： 提出了一种用于配置自动在线测试调试器的方法。 新颖的测试调试和优化配置技术将专家知识配置到知识框架中，供自动化测试调试和优化系统使用，以自动化在集成电路测试仪上执行的有效的稳定在线测试。 在包括用于控制集成电路测试器的测试头控制器和自动调试系统之间的交互的基于规则的控制器的系统中，本发明包括知识框架和基于规则的编辑器。 知识框架将测试知识存储在表示调试策略的规则表示中。 基于规则的编辑器有助于使用规则作为知识来调试或优化在集成电路测试仪上执行的在线测试。