发明申请
US20070025145A1 NON-VOLATILE MEMORY CELL USING HIGH-K MATERIAL AND INTER-GATE PROGRAMMING 有权
使用高K材料和栅极编程的非易失性存储单元

  • 专利标题: NON-VOLATILE MEMORY CELL USING HIGH-K MATERIAL AND INTER-GATE PROGRAMMING
  • 专利标题(中): 使用高K材料和栅极编程的非易失性存储单元
  • 申请号: US11470932
    申请日: 2006-09-07
  • 公开(公告)号: US20070025145A1
    公开(公告)日: 2007-02-01
  • 发明人: Nima MokhlesiJeffrey Lutze
  • 申请人: Nima MokhlesiJeffrey Lutze
  • 申请人地址: US CA Milpitas 95035
  • 专利权人: SanDisk Corporation
  • 当前专利权人: SanDisk Corporation
  • 当前专利权人地址: US CA Milpitas 95035
  • 主分类号: G11C16/04
  • IPC分类号: G11C16/04
NON-VOLATILE MEMORY CELL USING HIGH-K MATERIAL AND INTER-GATE PROGRAMMING
摘要:
A non-volatile memory device has a channel region between source/drain regions, a floating gate, a control gate, a first dielectric region between the channel region and the floating gate, and a second dielectric region between the floating gate and the control gate. The first dielectric region includes a high-K material. The non-volatile memory device is programmed and/or erased by transferring charge between the floating gate and the control gate via the second dielectric region.
信息查询
0/0