发明申请
- 专利标题： Method for test strip manufacturing and test card analysis
- 专利标题（中）： 测试条制造和测试卡分析方法
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申请号： US11504710申请日： 2006-08-16
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公开(公告)号： US20070040567A1公开(公告)日： 2007-02-22
- 发明人: Natasha Popovich , Brent Modzelewski , Dennis Slomski
- 申请人： Natasha Popovich , Brent Modzelewski , Dennis Slomski
- 主分类号： G01R31/26
- IPC分类号： G01R31/26
摘要：
A method of manufacturing a plurality of test strips is described where a web is formed containing conductive and base layers. A plurality of test strips are formed on the web by electrically isolating a first group of conductive components. Subsequently, a second group of conductive components are electrically isolated on the web by a different process. A test card for quality control analysis is also described, where the test card includes a plurality of attached test strip traces.
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