Invention Application
- Patent Title: Apparatus for measuring waveform of optical electric filed, optical transmission apparatus connected thereto and a method for producing the optical transmission apparatus
- Patent Title (中): 用于测量光电场波形的装置,与其连接的光传输装置及其制造方法
-
Application No.: US11511221Application Date: 2006-08-29
-
Publication No.: US20070046952A1Publication Date: 2007-03-01
- Inventor: Nobuhiko Kikuchi
- Applicant: Nobuhiko Kikuchi
- Assignee: Hitachi Communication Technologies, Ltd.
- Current Assignee: Hitachi Communication Technologies, Ltd.
- Priority: JP2005-252978 20050901
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01B11/02

Abstract:
An electric field waveform of an optical signal is precisely measured with high time resolution. Particularly, determination of inter-symbol interference has been difficult. Output light from the laser source is divided into first and second portions. The first portion is modulated by an optical modulator. The second portion is delayed by a delay line for the same quantity of delay as that of the first portion. The first and second portions are fed to a phase diversity circuit to configure a homodyne interferometer. An optical input sampling oscilloscope stabilizes a variable optical phase shifter to set an optical phase at a particular point of time to a fixed value using a pattern sync signal as a reference. An optical input sampling oscilloscope repeatedly averages optical waveforms and a CPU conducts three-dimensional display of the optical electric field waveform from which noise has been removed.
Public/Granted literature
Information query