Invention Application
US20070054445A1 METHOD OF MANUFACTURING NANO SCALE SEMICONDUCTOR DEVICE USING NANO PARTICLES
有权
使用纳米颗粒制造纳米尺度半导体器件的方法
- Patent Title: METHOD OF MANUFACTURING NANO SCALE SEMICONDUCTOR DEVICE USING NANO PARTICLES
- Patent Title (中): 使用纳米颗粒制造纳米尺度半导体器件的方法
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Application No.: US11240473Application Date: 2005-10-03
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Publication No.: US20070054445A1Publication Date: 2007-03-08
- Inventor: Hoon Kim , In-jae Song , Won-joo Kim , Byoung-lyong Choi
- Applicant: Hoon Kim , In-jae Song , Won-joo Kim , Byoung-lyong Choi
- Applicant Address: KR Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Gyeonggi-do
- Priority: KR10-2004-0097594 20041125
- Main IPC: H01L21/338
- IPC: H01L21/338 ; H01L21/461

Abstract:
Provided is a method of manufacturing a nano scale semiconductor device, such as a nano scale P-N junction device or a CMOS using nano particles without using a mask or a fine pattern. The method includes dispersing uniformly a plurality of nano particles on a semiconductor substrate, forming an insulating layer covering the nano particles on the semiconductor substrate, partly removing the upper surfaces of the nano particles and the insulating layer, selectively removing the nano particles from the insulating layer, and partly forming doped semiconductor layers in the semiconductor substrate by partly doping the semiconductor substrate through spaces formed by removing the nano particles.
Public/Granted literature
- US07192873B1 Method of manufacturing nano scale semiconductor device using nano particles Public/Granted day:2007-03-20
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