发明申请
- 专利标题: Scan verification for a device under test
- 专利标题(中): 对被测设备进行扫描验证
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申请号: US11206846申请日: 2005-08-18
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公开(公告)号: US20070061644A1公开(公告)日: 2007-03-15
- 发明人: Parag Birmiwal , Tilman Gloekler , Klaus Heinzelmann , Johannes Koesters
- 申请人: Parag Birmiwal , Tilman Gloekler , Klaus Heinzelmann , Johannes Koesters
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
Methods, apparatus, and products are disclosed for scan verification for a simulated device under test (‘DUT’), the DUT having scan chains, scan inputs, and scan outputs that include verifying correct data entry from the scan inputs of the DUT into the beginning of the scan chain, verifying correct propagation of scan data in the scan chain between the scan inputs and the scan outputs, verifying correct data output from the end of the scan chain to the scan outputs, and leak testing the scan chain with undetermined states for scan cells in the scan chain.
公开/授权文献
- US07386775B2 Scan verification for a scan-chain device under test 公开/授权日:2008-06-10