发明申请
- 专利标题: PROCESS FOR THE INSPECTION OF A VARIETY OF REPETITIVE STRUCTURES
- 专利标题(中): 检查多种重复结构的过程
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申请号: US11470884申请日: 2006-09-07
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公开(公告)号: US20070064992A1公开(公告)日: 2007-03-22
- 发明人: Michael Teich , Juliane Busch , Axel Becker , Ralf Keller , Jorg Kiesewetter , Ulf Hackius
- 申请人: Michael Teich , Juliane Busch , Axel Becker , Ralf Keller , Jorg Kiesewetter , Ulf Hackius
- 申请人地址: DE Sacka
- 专利权人: SUSS MICROTEC TEST SYSTEMS GMBH
- 当前专利权人: SUSS MICROTEC TEST SYSTEMS GMBH
- 当前专利权人地址: DE Sacka
- 优先权: DE102005044502.0 20050916
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
A process is provided for inspection of a variety of structures on the basis of a golden template, that was attained by recording and statistical analysis of greyscale pictures and is compared to the greyscale picture of the structure to be evaluated based on position. The underlying task is to report any such inspection process, with which a positioning of the test structure relative to the golden template and a structure detection with sub-pixel accuracy is carried out. In positioning of each further structure to be recorded, which follows a first recorded structure, the further structure is fundamentally positioned in accordance with the first positioned structure, applicable characteristic values of the greyscale picture recorded in this position are determined and hence a degree of similarity is determined. On this basis, the position of further structures relative to the primary position are determined and corrected with sub-pixel accuracy, before a new greyscale picture is recorded, which forms the basis for further analysis.
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