An electronic test apparatus for testing at least one circuit unit comprises a clock signal generator for generating a clock signal, a driver device comprising a plurality of driver subunits each generating a phase-shifted driver signal in response to said clock signal, a processing device for processing the phase-shifted driver signals and for comparing actual data being output by at least one circuit unit with desired data generated in the processing device, a connecting device for connecting the processing device to the at least one circuit unit and for transmitting the phase-shifted driver signals, the desired data, and the actual data between the processing device and the at least one circuit unit, and a combinational logic device for combining the phase-shifted driver signals to form a clock combination signal.