发明申请
US20070164214A1 Conductive carbon nanotube tip, probe having the conductive carbon nanotube tip, and method of manufacturing the conductive carbon nanotube tip
有权
导电性碳纳米管尖端，具有导电性碳纳米管尖端的探针，以及导电性碳纳米管尖端的制造方法
- 专利标题： Conductive carbon nanotube tip, probe having the conductive carbon nanotube tip, and method of manufacturing the conductive carbon nanotube tip
- 专利标题（中）： 导电性碳纳米管尖端，具有导电性碳纳米管尖端的探针，以及导电性碳纳米管尖端的制造方法
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申请号： US11513197申请日： 2006-08-31
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公开(公告)号： US20070164214A1公开(公告)日： 2007-07-19
- 发明人: Sang-jun Choi , Jung-Hyun Lee , Sang-bong Bang , Bum-seok Seo , Chang-soo Lee
- 申请人： Sang-jun Choi , Jung-Hyun Lee , Sang-bong Bang , Bum-seok Seo , Chang-soo Lee
- 申请人地址： KR Suwon-si
- 专利权人： SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人： SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址： KR Suwon-si
- 优先权： KR10-2006-0004170 20060114
- 主分类号： G12B21/02
- IPC分类号： G12B21/02
摘要：
A conductive carbon nanotube tip and a manufacturing method thereof are provided. The conductive carbon nanotube tip includes a carbon nanotube tip substantially vertically placed on a substrate, and a ruthenium coating layer covering a surface of the carbon nanotube tip and extending to at least a part of the substrate. The manufacturing method includes substantially vertically placing a carbon nanotube tip on a substrate, and forming a ruthenium coating layer on the carbon nanotube tip and at least a part of the substrate.
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