发明申请
- 专利标题: Methods of implanting ions and ion sources used for same
- 专利标题(中): 植入离子和离子源的方法
-
申请号: US11504355申请日: 2006-08-15
-
公开(公告)号: US20070178679A1公开(公告)日: 2007-08-02
- 发明人: Christopher Hatem , Anthony Renau , James E. White
- 申请人: Christopher Hatem , Anthony Renau , James E. White
- 申请人地址: US MA Gloucester
- 专利权人: Varian Semiconductor Equipment Associates, Inc.
- 当前专利权人: Varian Semiconductor Equipment Associates, Inc.
- 当前专利权人地址: US MA Gloucester
- 主分类号: H01L21/425
- IPC分类号: H01L21/425 ; H01J37/08
摘要:
A method of implanting ions comprising generating C2B10Hx, ions from C2B10H12 and implanting the C2B10Hx, ions in a material. In some embodiments, the molecular weight of the C2B10Hx, ions is greater than 100 amu. In other embodiments, the molecular weight of the C2B10Hx, ions is approximately 132 to 144 amu or approximately 136 to 138 amu. An ion source is also disclosed comprising a chamber housing defining a chamber and a source feed gas supply configured to introduce C2B10H12 into the chamber, wherein the ion source is configured to ionize the source feed gas within the chamber into C2B10Hxions.
信息查询
IPC分类: