发明申请
- 专利标题: UV blocking and crack protecting passivation layer
- 专利标题(中): UV阻挡和裂纹保护钝化层
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申请号: US11352169申请日: 2006-02-10
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公开(公告)号: US20070187813A1公开(公告)日: 2007-08-16
- 发明人: Lee Chen , Shing Luo , Chin Su
- 申请人: Lee Chen , Shing Luo , Chin Su
- 申请人地址: TW HSINCHU
- 专利权人: MACRONIX INTERNATIONAL CO., LTD.
- 当前专利权人: MACRONIX INTERNATIONAL CO., LTD.
- 当前专利权人地址: TW HSINCHU
- 主分类号: H01L23/053
- IPC分类号: H01L23/053 ; H01L23/12
摘要:
A semiconductor device comprises a substrate, a patterned metal conductor layer over the substrate, and a passivation layer. The passivation layer may comprise a UV blocking, protection layer, over at least a portion of the substrate and patterned metal conductor layers, and a separation layer between the patterned metal conductor layer and the UV protection layer. The passivation layer may also comprise a gap-filling, hydrogen-blocking layer over the substrate, the patterned metal conductor layer and any UV protection layer.
公开/授权文献
- US07755197B2 UV blocking and crack protecting passivation layer 公开/授权日:2010-07-13
信息查询
IPC分类: