Invention Application
US20070204248A1 Delay analyzing method, delay analyzing apparatus, and computer product 有权
延迟分析方法,延迟分析仪器和计算机产品

Delay analyzing method, delay analyzing apparatus, and computer product
Abstract:
A delay analyzing apparatus receives a result of timing analysis of a target circuit, and detects, from paths in the target circuit, critical paths based on the result of the timing analysis with a detecting unit. A first calculating unit calculates an average delay distribution of the paths other than the critical paths based on an average delay value of each of the critical paths. A second calculating unit calculates a probability density distribution of the critical paths, and a third calculating unit calculates a probability density distribution of all of the paths based on the average delay distribution. A fourth calculating unit calculates difference between a statistical delay value of the critical paths and a statistical delay value of all of the paths based on the probability density distribution of the critical paths and the probability density distribution of all of the paths.
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