发明申请
US20070245197A1 Method and apparatus for identifying paths having appropriate lengths for fault simulation
有权
用于识别具有用于故障模拟的适当长度的路径的方法和装置
- 专利标题: Method and apparatus for identifying paths having appropriate lengths for fault simulation
- 专利标题(中): 用于识别具有用于故障模拟的适当长度的路径的方法和装置
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申请号: US11521173申请日: 2006-09-14
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公开(公告)号: US20070245197A1公开(公告)日: 2007-10-18
- 发明人: Takahisa Hiraide
- 申请人: Takahisa Hiraide
- 专利权人: FUJITSU LIMITED
- 当前专利权人: FUJITSU LIMITED
- 优先权: JP2006-093822 20060330
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; G06F11/00
摘要:
A fault analysis apparatus includes: an extracting unit that extracts a segment including a point of fault from a plurality of paths in a target circuit; a detecting unit that detects a candidate path that extends, via the segment, from an upstream circuit element to a downstream circuit element; a judging unit that judges whether length of the candidate path is longer than a predetermined length; and a determining unit that determines whether to determine the candidate path as a target path to be subjected to a fault simulation based on a result of judgment.
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