发明申请
US20070245197A1 Method and apparatus for identifying paths having appropriate lengths for fault simulation 有权
用于识别具有用于故障模拟的适当长度的路径的方法和装置

  • 专利标题: Method and apparatus for identifying paths having appropriate lengths for fault simulation
  • 专利标题(中): 用于识别具有用于故障模拟的适当长度的路径的方法和装置
  • 申请号: US11521173
    申请日: 2006-09-14
  • 公开(公告)号: US20070245197A1
    公开(公告)日: 2007-10-18
  • 发明人: Takahisa Hiraide
  • 申请人: Takahisa Hiraide
  • 专利权人: FUJITSU LIMITED
  • 当前专利权人: FUJITSU LIMITED
  • 优先权: JP2006-093822 20060330
  • 主分类号: G01R31/28
  • IPC分类号: G01R31/28 G06F11/00
Method and apparatus for identifying paths having appropriate lengths for fault simulation
摘要:
A fault analysis apparatus includes: an extracting unit that extracts a segment including a point of fault from a plurality of paths in a target circuit; a detecting unit that detects a candidate path that extends, via the segment, from an upstream circuit element to a downstream circuit element; a judging unit that judges whether length of the candidate path is longer than a predetermined length; and a determining unit that determines whether to determine the candidate path as a target path to be subjected to a fault simulation based on a result of judgment.
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