发明申请
US20080046789A1 APPARATUS AND METHOD FOR TESTING MEMORY DEVICES AND CIRCUITS IN INTEGRATED CIRCUITS
审中-公开
用于测试集成电路中的存储器件和电路的装置和方法
- 专利标题: APPARATUS AND METHOD FOR TESTING MEMORY DEVICES AND CIRCUITS IN INTEGRATED CIRCUITS
- 专利标题(中): 用于测试集成电路中的存储器件和电路的装置和方法
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申请号: US11465864申请日: 2006-08-21
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公开(公告)号: US20080046789A1公开(公告)日: 2008-02-21
- 发明人: Igor Arsovski , Valerie Chickanosky , Rahul Nadkarni , Michael Oucllette , Reid Wistort
- 申请人: Igor Arsovski , Valerie Chickanosky , Rahul Nadkarni , Michael Oucllette , Reid Wistort
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
This patent describes a method for varying the amplitude and frequency of power supply oscillations produced by content addressable memories or other critical circuits using BIST. Supply oscillations are produced by performing noisy (high switching activity—high current demand) searches followed by quiet (low switching activity—low current demand) searches. The amplitude and frequency of oscillations can be varied by changing the number of noisy and quiet searches e.g. pattern 1-noisy quiet, noisy, quiet; pattern 2-noisy, noisy, quiet, noisy, noisy, quiet, etc. By going through different patterns the current demand from the CAM macro increases the likelihood of producing worst—case noise and enables testing of CAM operation as well as surrounding circuitry in these noisy conditions.
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