发明申请
US20080077833A1 METHOD AND STRUCTURE FOR PICOSECOND-IMAGING-CIRCUIT-ANALYSIS BASED BUILT-IN-SELF-TEST DIAGNOSTIC
失效
基于PICOSECOND-IMAGING-CIRCUIT-ANALYSIS的内置自检测试方法和结构
- 专利标题： METHOD AND STRUCTURE FOR PICOSECOND-IMAGING-CIRCUIT-ANALYSIS BASED BUILT-IN-SELF-TEST DIAGNOSTIC
- 专利标题（中）： 基于PICOSECOND-IMAGING-CIRCUIT-ANALYSIS的内置自检测试方法和结构
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申请号： US11927030申请日： 2007-10-29
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公开(公告)号： US20080077833A1公开(公告)日： 2008-03-27
- 发明人: Franco Motika , Peitin Song
- 申请人： Franco Motika , Peitin Song
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
A method (and structure) of at least one of testing, diagnosing, and monitoring an operation of an electronic circuit, includes interrupting a clock signal used to provide a clocking for a normal operation of the circuit and using a second clock signal to repeatedly cycle through a predetermined cycle of operations for the circuit.
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