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1.发明申请METHOD AND STRUCTURE FOR PICOSECOND-IMAGING-CIRCUIT-ANALYSIS BASED BUILT-IN-SELF-TEST DIAGNOSTIC 失效基于PICOSECOND-IMAGING-CIRCUIT-ANALYSIS的内置自检测试方法和结构公开(公告)号：US20080077833A1
公开(公告)日：2008-03-27
申请号：US11927030
申请日：2007-10-29
申请人： Franco Motika , Peitin Song
发明人： Franco Motika , Peitin Song
IPC分类号： G01R31/28
CPC分类号： G01R31/318547 , G01R31/311
摘要： A method (and structure) of at least one of testing, diagnosing, and monitoring an operation of an electronic circuit, includes interrupting a clock signal used to provide a clocking for a normal operation of the circuit and using a second clock signal to repeatedly cycle through a predetermined cycle of operations for the circuit.
摘要翻译： 测试，诊断和监视电子电路的操作中的至少一个的方法（和结构）包括中断用于为电路的正常操作提供时钟的时钟信号，并且使用第二时钟信号重复循环 通过电路的预定操作周期。
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2.发明授权Method and structure for picosecond-imaging-circuit-analysis based built-in-self-test diagnostic 失效基于皮秒成像 - 电路分析的内置自检诊断方法和结构公开(公告)号：US07774662B2
公开(公告)日：2010-08-10
申请号：US11927030
申请日：2007-10-29
申请人： Franco Motika , Peitin Song
发明人： Franco Motika , Peitin Song
IPC分类号： G01R31/28
CPC分类号： G01R31/318547 , G01R31/311
摘要： A method (and structure) of at least one of testing, diagnosing, and monitoring an operation of an electronic circuit, includes interrupting a clock signal used to provide a clocking for a normal operation of the circuit and using a second clock signal to repeatedly cycle through a predetermined cycle of operations for the circuit.
摘要翻译： 测试，诊断和监视电子电路的操作中的至少一个的方法（和结构）包括中断用于为电路的正常操作提供时钟的时钟信号，并且使用第二时钟信号重复循环 通过电路的预定操作周期。
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