发明申请
- 专利标题: METHOD OF FORMING A PHASE-CHANGEABLE LAYER AND METHOD OF MANUFACTURING A SEMICONDUCTOR MEMORY DEVICE USING THE SAME
- 专利标题(中): 形成相变层的方法及使用其制造半导体存储器件的方法
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申请号: US11876631申请日: 2007-10-22
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公开(公告)号: US20080096386A1公开(公告)日: 2008-04-24
- 发明人: Young-Lim PARK , Sung-Lae CHO , Byoung-Jae BAE , Jin-Il LEE , Hye-Young PARK , Ji-Eun LIM
- 申请人: Young-Lim PARK , Sung-Lae CHO , Byoung-Jae BAE , Jin-Il LEE , Hye-Young PARK , Ji-Eun LIM
- 申请人地址: KR Gyeonggi-do
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Gyeonggi-do
- 优先权: KR2006-102415 20061020
- 主分类号: H01L21/02
- IPC分类号: H01L21/02
摘要:
A phase-changeable layer and a method of forming the same are disclosed. In the method, a first hydrogen gas is introduced into a reaction chamber into which a substrate is loaded at a first flow rate to form first plasma. A primary cyclic CVD process is carried out using precursors in the reaction chamber to form a lower phase-changeable layer having a first grain size on the substrate. A second hydrogen gas is introduced into the reaction chamber at a second flow rate less than the first flow rate to form second plasma. A secondary cyclic CVD process is carried out using the precursors in the reaction chamber to form an upper phase-changeable layer having a second grain size smaller than the first grain size on the substrate, thereby forming a phase-changeable layer. Thus, the phase-changeable layer may have strong adhesion strength with respect to a lower layer and good electrical characteristics.
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