发明申请
US20080113876A1 Probe array and associated methods 审中-公开
探头数组及相关方法

Probe array and associated methods
摘要:
A probe array includes a substrate having at least two projecting features adjacent to one another, each feature including a top surface and a side surface, an isolation region separating the at least two features, at least two active regions, the at least two active regions including the top surfaces of the at least two features, and an inactive region separating the at least two active regions, the inactive region including the isolation region.
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