发明申请
- 专利标题: Probe array and associated methods
- 专利标题(中): 探头数组及相关方法
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申请号: US11889455申请日: 2007-08-13
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公开(公告)号: US20080113876A1公开(公告)日: 2008-05-15
- 发明人: Won-sun Kim , Sung-min Chi , Jung-hwan Hah , Kyoung-seon Kim , Sang-jun Choi , Man-hyoung Ryoo
- 申请人: Won-sun Kim , Sung-min Chi , Jung-hwan Hah , Kyoung-seon Kim , Sang-jun Choi , Man-hyoung Ryoo
- 优先权: KR10-2006-0076900 20060814
- 主分类号: C40B30/04
- IPC分类号: C40B30/04 ; C40B40/00 ; C40B50/18
摘要:
A probe array includes a substrate having at least two projecting features adjacent to one another, each feature including a top surface and a side surface, an isolation region separating the at least two features, at least two active regions, the at least two active regions including the top surfaces of the at least two features, and an inactive region separating the at least two active regions, the inactive region including the isolation region.
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