发明申请
US20080191757A1 Delay locked loop circuit with duty cycle correction and method of controlling the same
失效
具有占空比校正的延迟锁定环路电路及其控制方法
- 专利标题: Delay locked loop circuit with duty cycle correction and method of controlling the same
- 专利标题(中): 具有占空比校正的延迟锁定环路电路及其控制方法
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申请号: US11878244申请日: 2007-07-23
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公开(公告)号: US20080191757A1公开(公告)日: 2008-08-14
- 发明人: Hoon Choi
- 申请人: Hoon Choi
- 申请人地址: KR Gyeonggi-do
- 专利权人: Hynix Semiconductor Inc.
- 当前专利权人: Hynix Semiconductor Inc.
- 当前专利权人地址: KR Gyeonggi-do
- 优先权: KR10-2007-0014061 20070209
- 主分类号: H03L7/085
- IPC分类号: H03L7/085 ; H03K5/05 ; H03L7/08
摘要:
A delay locked loop block receives external clocks to generate first internal clocks including a reference clock. An internal delay unit delays the first internal clocks to output second internal clocks, which are fed back to the delay locked loop block. The delay locked loop block adjusts delay time of the delay unit according to a phase difference between each second internal clock and the reference clock so that the second internal clocks are delay locked. A duty cycle correcting block corrects a duty cycle of each second internal clock and outputs a duty cycle corrected clock. An error determining unit compares a phase of each second internal clock with one another and, based on the comparison, feeds back a feedback clock including one of the duty cycle corrected clock or the second internal clock to the delay locked loop block.
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