Invention Application
- Patent Title: DYNAMIC CONTROL OF PROCESS CHEMISTRY FOR IMPROVED WITHIN-SUBSTRATE PROCESS UNIFORMITY
- Patent Title (中): 改进基板工艺均匀性的工艺化学动态控制
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Application No.: US11684853Application Date: 2007-03-12
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Publication No.: US20080223873A1Publication Date: 2008-09-18
- Inventor: Lee Chen , Radha Sundararajan , Merritt Funk
- Applicant: Lee Chen , Radha Sundararajan , Merritt Funk
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Main IPC: C23F1/02
- IPC: C23F1/02

Abstract:
A method and system for dynamically controlling a process chemistry above a substrate is described. The system for adjusting the process chemistry comprises a ring configured to surround a peripheral edge of a substrate in a vacuum processing system. The ring comprises one or more gas distribution passages formed within the ring and configured to supply an additive process gas through an upper surface of the ring to the peripheral region of the substrate, wherein the one or more gas distribution passages are configured to be coupled to one or more corresponding gas supply passages formed within the substrate holder upon which the ring rests.
Public/Granted literature
- US07988813B2 Dynamic control of process chemistry for improved within-substrate process uniformity Public/Granted day:2011-08-02
Information query
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