发明申请
- 专利标题: DYNAMIC CONTROL OF PROCESS CHEMISTRY FOR IMPROVED WITHIN-SUBSTRATE PROCESS UNIFORMITY
- 专利标题(中): 改进基板工艺均匀性的工艺化学动态控制
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申请号: US11684853申请日: 2007-03-12
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公开(公告)号: US20080223873A1公开(公告)日: 2008-09-18
- 发明人: Lee Chen , Radha Sundararajan , Merritt Funk
- 申请人: Lee Chen , Radha Sundararajan , Merritt Funk
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 主分类号: C23F1/02
- IPC分类号: C23F1/02
摘要:
A method and system for dynamically controlling a process chemistry above a substrate is described. The system for adjusting the process chemistry comprises a ring configured to surround a peripheral edge of a substrate in a vacuum processing system. The ring comprises one or more gas distribution passages formed within the ring and configured to supply an additive process gas through an upper surface of the ring to the peripheral region of the substrate, wherein the one or more gas distribution passages are configured to be coupled to one or more corresponding gas supply passages formed within the substrate holder upon which the ring rests.
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