发明申请
- 专利标题: Optical element contamination preventing method and optical element contamination preventing device of extreme ultraviolet light source
- 专利标题(中): 光学元件污染防治方法和极紫外光源的光学元件污染防治装置
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申请号: US12150077申请日: 2008-04-24
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公开(公告)号: US20080267816A1公开(公告)日: 2008-10-30
- 发明人: Yoshifumi Ueno , Masato Moriya , Masaki Nakano , Hiroshi Komori
- 申请人: Yoshifumi Ueno , Masato Moriya , Masaki Nakano , Hiroshi Komori
- 申请人地址: JP Tokyo
- 专利权人: KOMATSU LTD.
- 当前专利权人: KOMATSU LTD.
- 当前专利权人地址: JP Tokyo
- 优先权: JP2007-118965 20070427
- 主分类号: A61L2/00
- IPC分类号: A61L2/00
摘要:
Solid tin (Sn) is used as a target, a CO2 laser is used as an excitation source for the target, and after the size of debris emitted from plasma is decreased to a nanometer or smaller size by exciting the solid tin by a laser beam outputted from the CO2 laser, the emitted debris of a nanometer or smaller size is acted upon so as not to reach the optical element. In accordance with the present invention, in the EUV light source apparatus, the debris emitted together with EUV light from plasma generated by exciting a target within a chamber by a laser beam is prevented from adhering to an optical element provided within the chamber and forming a metal film. As a result, the service life of the optical element can be extended.
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