Optical element contamination preventing method and optical element contamination preventing device of extreme ultraviolet light source
    1.
    发明授权
    Optical element contamination preventing method and optical element contamination preventing device of extreme ultraviolet light source 有权
    光学元件污染防治方法和极紫外光源的光学元件污染防治装置

    公开(公告)号:US08129700B2

    公开(公告)日:2012-03-06

    申请号:US12150077

    申请日:2008-04-24

    IPC分类号: H05G2/00

    CPC分类号: B08B17/02 H05G2/003 H05G2/008

    摘要: Solid tin (Sn) is used as a target, a CO2 laser is used as an excitation source for the target, and after the size of debris emitted from plasma is decreased to a nanometer or smaller size by exciting the solid tin by a laser beam outputted from the CO2 laser, the emitted debris of a nanometer or smaller size is acted upon so as not to reach the optical element. In accordance with the present invention, in the EUV light source apparatus, the debris emitted together with EUV light from plasma generated by exciting a target within a chamber by a laser beam is prevented from adhering to an optical element provided within the chamber and forming a metal film. As a result, the service life of the optical element can be extended.

    摘要翻译: 使用固体锡(Sn)作为目标,使用CO 2激光作为靶的激发源,并且在通过激光束激发固体锡后,从等离子体发射的碎片的尺寸减小到纳米或更小的尺寸之后 从CO 2激光器输出的纳米尺寸或更小尺寸的发射碎片被作用到不会到达光学元件。 根据本发明,在EUV光源装置中,防止了通过用激光束激发室内的目标物而产生的来自等离子体的EUV光一起发射的碎片附着在设置在室内的光学元件,并形成 金属膜。 结果,可以延长光学元件的使用寿命。

    Optical element contamination preventing method and optical element contamination preventing device of extreme ultraviolet light source
    2.
    发明申请
    Optical element contamination preventing method and optical element contamination preventing device of extreme ultraviolet light source 有权
    光学元件污染防治方法和极紫外光源的光学元件污染防治装置

    公开(公告)号:US20080267816A1

    公开(公告)日:2008-10-30

    申请号:US12150077

    申请日:2008-04-24

    IPC分类号: A61L2/00

    CPC分类号: B08B17/02 H05G2/003 H05G2/008

    摘要: Solid tin (Sn) is used as a target, a CO2 laser is used as an excitation source for the target, and after the size of debris emitted from plasma is decreased to a nanometer or smaller size by exciting the solid tin by a laser beam outputted from the CO2 laser, the emitted debris of a nanometer or smaller size is acted upon so as not to reach the optical element. In accordance with the present invention, in the EUV light source apparatus, the debris emitted together with EUV light from plasma generated by exciting a target within a chamber by a laser beam is prevented from adhering to an optical element provided within the chamber and forming a metal film. As a result, the service life of the optical element can be extended.

    摘要翻译: 使用固体锡(Sn)作为目标,使用CO 2激光作为靶的激发源,并且在从等离子体发射的碎片的尺寸通过以下方式减小到纳米或更小的尺寸之后 通过从CO 2激光器输出的激光束激发固体锡,发射的纳米或更小尺寸的碎片被作用到不会到达光学元件。 根据本发明,在EUV光源装置中,防止了通过用激光束激发室内的目标物而产生的来自等离子体的EUV光一起发射的碎片附着在设置在室内的光学元件,并形成 金属膜。 结果,可以延长光学元件的使用寿命。

    Method for cleaning optical element of EUV light source device and optical element cleaning device
    3.
    发明授权
    Method for cleaning optical element of EUV light source device and optical element cleaning device 有权
    用于清洁EUV光源装置和光学元件清洁装置的光学元件的方法

    公开(公告)号:US08256441B2

    公开(公告)日:2012-09-04

    申请号:US12148969

    申请日:2008-04-24

    摘要: A method for cleaning an optical element of an extreme ultraviolet light source device for removing, from the optical element in a chamber, scattered matter generated together with extreme ultraviolet light by plasma formed through laser beam excitation of a target in the chamber, the method which comprises: making the scattered matter generated by the plasma no larger than nanosize by using solid tin as the target and using a CO2 laser as an excitation source of the solid tin; and imparting, to the scattered matter no larger than the nanosize adhered to the optical element, an effect of overcoming the adherence of the scattered matter.

    摘要翻译: 一种用于清除极紫外光源装置的光学元件的方法,用于从腔室中的光学元件除去通过室中的靶的激光束激发而形成的等离子体与极紫外光一起产生的散射物质, 包括:通过使用固体锡作为目标并使用CO 2激光器作为固体锡的激发源,使由等离子体产生的散射物质不大于纳米尺寸; 并且对不大于粘附到光学元件的纳米尺度的散射物质赋予克服散射物质的粘附的效果。

    Method for cleaning optical element of EUV light source device and optical element cleaning device
    4.
    发明申请
    Method for cleaning optical element of EUV light source device and optical element cleaning device 有权
    用于清洁EUV光源装置和光学元件清洁装置的光学元件的方法

    公开(公告)号:US20100025231A1

    公开(公告)日:2010-02-04

    申请号:US12148969

    申请日:2008-04-24

    IPC分类号: C23C14/34 B08B7/00

    摘要: A method for cleaning an optical element of an extreme ultraviolet light source device for removing, from the optical element in a chamber, scattered matter generated together with extreme ultraviolet light by plasma formed through laser beam excitation of a target in the chamber, the method which comprises: making the scattered matter generated by the plasma no larger than nanosize by using solid tin as the target and using a CO2 laser as an excitation source of the solid tin; and imparting, to the scattered matter no larger than the nanosize adhered to the optical element, an effect of overcoming the adherence of the scattered matter.

    摘要翻译: 一种用于清除极紫外光源装置的光学元件的方法,用于从腔室中的光学元件除去通过室中的靶的激光束激发而形成的等离子体与极紫外光一起产生的散射物质, 包括:通过使用固体锡作为目标并使用CO 2激光器作为固体锡的激发源,使由等离子体产生的散射物质不大于纳米尺寸; 并且对不大于粘附到光学元件的纳米尺度的散射物质赋予克服散射物质的粘附的效果。

    METHOD FOR CLEANING OPTICAL ELEMENT OF EUV LIGHT SOURCE DEVICE AND OPTICAL ELEMENT CLEANING DEVICE
    5.
    发明申请
    METHOD FOR CLEANING OPTICAL ELEMENT OF EUV LIGHT SOURCE DEVICE AND OPTICAL ELEMENT CLEANING DEVICE 审中-公开
    清洗光源装置和光元件清洁装置的光学元件的方法

    公开(公告)号:US20120298134A1

    公开(公告)日:2012-11-29

    申请号:US13567656

    申请日:2012-08-06

    IPC分类号: B08B7/00 C23F1/08

    摘要: A method for cleaning an optical element of an extreme ultraviolet light source device for removing, from the optical element in a chamber, scattered matter generated together with extreme ultraviolet light by plasma formed through laser beam excitation of a target in the chamber, the method which comprises: making the scattered matter generated by the plasma no larger than nanosize by using solid tin as the target and using a CO2 laser as an excitation source of the solid tin; and imparting, to the scattered matter no larger than the nanosize adhered to the optical element, an effect of overcoming the adherence of the scattered matter.

    摘要翻译: 一种用于清除极紫外光源装置的光学元件的方法,用于从腔室中的光学元件除去通过室中的靶的激光束激发而形成的等离子体与极紫外光一起产生的散射物质, 包括:通过使用固体锡作为目标并使用CO 2激光器作为固体锡的激发源,使由等离子体产生的散射物质不大于纳米尺寸; 并且对不大于粘附到光学元件的纳米尺度的散射物质赋予克服散射物质的粘附的效果。

    Extreme ultraviolet light source device and method for producing extreme ultraviolet light
    6.
    发明授权
    Extreme ultraviolet light source device and method for producing extreme ultraviolet light 有权
    极紫外光源装置及其制造方法

    公开(公告)号:US08471226B2

    公开(公告)日:2013-06-25

    申请号:US12547896

    申请日:2009-08-26

    IPC分类号: A61N5/06

    摘要: An EUV (Extreme Ultra Violet) light source device ionizes a target material in an ionizer, and supplies the ionized target material to a point of generating a plasma. This reduces the generation of debris. The ionizer simultaneously irradiates laser beams of plural wavelengths corresponding to the excited level of tin on a target material to ionize the target material. The ionized target material is extracted from the ionizer with a high voltage applied from an ion beam extractor, and accelerated and supplied to a plasma generation chamber. When driver laser beam is irradiated on the ionized target material, a plasma is generated, thereby emitting EUV radiation.

    摘要翻译: EUV(Extreme Ultra Violet)光源装置将离子发生器中的目标材料离子化,并将电离靶材材料提供到产生等离子体的点。 这减少了碎片的产生。 离子发生器同时将与激发的锡水平相对应的多个波长的激光束照射在目标材料上以电离目标材料。 电离目标材料从离子束提取器施加的高电压从电离器中提取,并被加速并提供给等离子体产生室。 当驱动激光束照射在电离靶材上时,产生等离子体,从而发射EUV辐射。

    EXTREME ULTRA VIOLET LIGHT SOURCE APPARATUS
    7.
    发明申请
    EXTREME ULTRA VIOLET LIGHT SOURCE APPARATUS 有权
    极光紫外线光源设备

    公开(公告)号:US20110163247A1

    公开(公告)日:2011-07-07

    申请号:US13047131

    申请日:2011-03-14

    IPC分类号: G21K5/00

    摘要: In an extreme ultra violet light source apparatus of a laser produced plasma type, charged particles such as ions emitted from plasma are promptly ejected to the outside of a chamber. The extreme ultra violet light source apparatus includes a chamber in which extreme ultra violet light is generated, a target supply unit for supplying a target material to a predetermined position within the chamber, a driver laser for applying a laser beam to the target material supplied by the target supply unit to generate plasma, a collector mirror for collecting the extreme ultra violet light radiated from the plasma to output the extreme ultra violet light, a magnetic field forming unit for forming an asymmetric magnetic field in a generation position of the plasma by using a coil, and a charged particle collection mechanism provided on at least one of two surfaces of the chamber to which lines of magnetic force generated by the coil extend.

    摘要翻译: 在激光产生的等离子体型的极紫外光源装置中,将从等离子体发射的离子等带电粒子迅速地排出到室外。 极紫外光源装置包括产生极紫外光的室,用于将目标材料供应到室内的预定位置的目标供应单元,用于将激光束施加到由 用于产生等离子体的目标供应单元,用于收集从等离子体辐射的极端紫外光以输出极紫外光的集光镜;用于在等离子体的产生位置形成非对称磁场的磁场形成单元,其通过使用 线圈和带电粒子收集机构,设置在腔室的两个表面中的至少一个上,线圈产生的磁力线延伸到该表面。

    Extreme ultra violet light source apparatus
    8.
    发明授权
    Extreme ultra violet light source apparatus 有权
    极紫外光源装置

    公开(公告)号:US08354657B2

    公开(公告)日:2013-01-15

    申请号:US13047131

    申请日:2011-03-14

    IPC分类号: A61N5/06 G01J3/10

    摘要: In an extreme ultra violet light source apparatus of a laser produced plasma type, charged particles such as ions emitted from plasma are promptly ejected to the outside of a chamber. The apparatus includes a chamber, a target supply unit for supplying a target material into the chamber, a collector mirror for collecting extreme ultra violet light radiated from plasma generated by irradiating the target material with a laser beam to output the extreme ultra violet light, an electromagnet arranged outside of the chamber, and a charged particle collection mechanism provided on at least one of two surfaces of the chamber to which lines of magnetic force generated by the electromagnet extend.

    摘要翻译: 在激光产生的等离子体型的极紫外光源装置中,将从等离子体发射的离子等带电粒子迅速地排出到室外。 该装置包括:室,用于将目标材料供应到室中的目标供应单元,用于收集由用激光束照射目标材料而产生的等离子体辐射的极紫外光以输出极紫外光的集光镜; 设置在室外的电磁体,以及设置在室的两个表面中的至少一个表面上的电荷粒子收集机构,由电磁体产生的磁力线延伸。

    EXTREME ULTRAVIOLET LIGHT SOURCE DEVICE AND METHOD FOR PRODUCING EXTREME ULTRAVIOLET LIGHT
    9.
    发明申请
    EXTREME ULTRAVIOLET LIGHT SOURCE DEVICE AND METHOD FOR PRODUCING EXTREME ULTRAVIOLET LIGHT 有权
    极光紫外线光源装置及生产超极紫外线灯的方法

    公开(公告)号:US20110101863A1

    公开(公告)日:2011-05-05

    申请号:US12547896

    申请日:2009-08-26

    IPC分类号: H01J7/00

    摘要: An EUV (Extreme Ultra Violet) light source device ionizes a target material in an ionizer, and supplies the ionized target material to a point of generating a plasma. This reduces the generation of debris. The ionizer simultaneously irradiates laser beams of plural wavelengths corresponding to the excited level of tin on a target material to ionize the target material. The ionized target material is extracted from the ionizer with a high voltage applied from an ion beam extractor, and accelerated and supplied to a plasma generation chamber. When driver laser beam is irradiated on the ionized target material, a plasma is generated, thereby emitting EUV radiation.

    摘要翻译: EUV(Extreme Ultra Violet)光源装置将离子发生器中的目标材料离子化,并将电离靶材材料提供到产生等离子体的点。 这减少了碎片的产生。 离子发生器同时将与激发的锡水平相对应的多个波长的激光束照射在目标材料上以电离目标材料。 电离目标材料从离子束提取器施加的高电压从电离器中提取,并被加速并提供给等离子体产生室。 当驱动激光束照射在电离靶材上时,产生等离子体,从而发射EUV辐射。

    Extreme ultra violet light source apparatus
    10.
    发明授权
    Extreme ultra violet light source apparatus 有权
    极紫外光源装置

    公开(公告)号:US07928418B2

    公开(公告)日:2011-04-19

    申请号:US12385569

    申请日:2009-04-13

    IPC分类号: A61N5/06 G01J3/10 H05G2/00

    摘要: In an extreme ultra violet light source apparatus of a laser produced plasma type, charged particles such as ions emitted from plasma are promptly ejected to the outside of a chamber. The extreme ultra violet light source apparatus includes a chamber in which extreme ultra violet light is generated, a target supply unit for supplying a target material to a predetermined position within the chamber, a driver laser for applying a laser beam to the target material supplied by the target supply unit to generate plasma, a collector mirror for collecting the extreme ultra violet light radiated from the plasma to output the extreme ultra violet light, a magnetic field forming unit for forming an asymmetric magnetic field in a generation position of the plasma by using a coil, and a charged particle collection mechanism provided on at least one of two surfaces of the chamber to which lines of magnetic force generated by the coil extend.

    摘要翻译: 在激光产生的等离子体型的极紫外光源装置中,将从等离子体发射的离子等带电粒子迅速地排出到室外。 极紫外光源装置包括产生极紫外光的室,用于将目标材料供应到室内的预定位置的目标供应单元,用于将激光束施加到由 用于产生等离子体的目标供应单元,用于收集从等离子体辐射的极端紫外光以输出极紫外光的集光镜;用于在等离子体的产生位置形成非对称磁场的磁场形成单元,其通过使用 线圈和带电粒子收集机构,设置在腔室的两个表面中的至少一个上,线圈产生的磁力线延伸到该表面。