发明申请
US20080315871A1 FLEXIBLE ARRAY PROBE FOR THE INSPECTION OF A CONTOURED SURFACE WITH VARYING CROSS-SECTIONAL GEOMETRY
有权
灵活的阵列探针,用于检查具有变化的跨剖面几何的轮廓表面
- 专利标题: FLEXIBLE ARRAY PROBE FOR THE INSPECTION OF A CONTOURED SURFACE WITH VARYING CROSS-SECTIONAL GEOMETRY
- 专利标题(中): 灵活的阵列探针,用于检查具有变化的跨剖面几何的轮廓表面
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申请号: US12123834申请日: 2008-05-20
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公开(公告)号: US20080315871A1公开(公告)日: 2008-12-25
- 发明人: Benoit Lepage , Martin Roy , Stefano Orsi
- 申请人: Benoit Lepage , Martin Roy , Stefano Orsi
- 主分类号: G01N27/90
- IPC分类号: G01N27/90 ; G01N27/83 ; G01N29/04
摘要:
A flexible array probe is disclosed suitable for use in the non-destructive testing and inspection of test pieces with varying cross-sectional geometries. Array elements—such as, but not limited to, eddy current sensors, piezoelectric sensor elements, and magnetic flux leakage sensors—are mounted on thin alignment fins and coupled together with pairs of pivot mechanisms along the axis of desired rotation. The pivot mechanisms allow rotation in exactly one dimension and force the flexible array probe to align its elements orthogonally to the surface of the structure under test. Alignment and coupling fixtures are also disclosed.
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