发明申请
US20090051396A1 Ring Oscillation Circuit, Delay Time Measuring Circuit, Testing Circuit, Clock Generating Circuit, Image Sensor, Pulse Generating Circuit, Semiconductor Integrated Circuit, and Testing Method Thereof 失效
环形振荡电路,延迟时间测量电路,测试电路,时钟发生电路,图像传感器,脉冲发生电路,半导体集成电路及其测试方法

  • 专利标题: Ring Oscillation Circuit, Delay Time Measuring Circuit, Testing Circuit, Clock Generating Circuit, Image Sensor, Pulse Generating Circuit, Semiconductor Integrated Circuit, and Testing Method Thereof
  • 专利标题(中): 环形振荡电路,延迟时间测量电路,测试电路,时钟发生电路,图像传感器,脉冲发生电路,半导体集成电路及其测试方法
  • 申请号: US12223532
    申请日: 2006-11-30
  • 公开(公告)号: US20090051396A1
    公开(公告)日: 2009-02-26
  • 发明人: Yukihiro Shimamoto
  • 申请人: Yukihiro Shimamoto
  • 优先权: JP2006-025188 20060202; JP2006-220184 20060811
  • 国际申请: PCT/JP2006/323941 WO 20061130
  • 主分类号: H03L7/00
  • IPC分类号: H03L7/00 H03K3/03 G04F10/06
Ring Oscillation Circuit, Delay Time Measuring Circuit, Testing Circuit, Clock Generating Circuit, Image Sensor, Pulse Generating Circuit, Semiconductor Integrated Circuit, and Testing Method Thereof
摘要:
A ring oscillation circuit, which can operate the ring oscillation due to a positive feedback stably and continuously, is provided and it is applied to an accurate measurement of delay time and a measurement of timing accuracy in a jitter of a clock signal or the like with a high accuracy. A ring oscillation circuit comprises a delay circuit and a monostable multivibrator. An output of the delay circuit is connected to an input of the monostable multivibrator, an output of the monostable multivibrator is connected to an input of the delay circuit, and the delay circuit and the monostable multivibrator configure a positive feedback loop. An oscillation starting circuit for starting oscillation upon receipt of an input of a trigger pulse for triggering oscillation is provided on the positive feedback loop, or in the inside of the delay circuit or the monostable multivibrator.
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