发明申请
- 专利标题: Automated selection of x-ray reflectometry measurement locations
- 专利标题(中): 自动选择x射线反射测量位置
-
申请号: US12232259申请日: 2008-09-12
-
公开(公告)号: US20090074141A1公开(公告)日: 2009-03-19
- 发明人: Isaac Mazor , Alex Dikopoltsev , Boris Yokhin , Dileep Agnihotri , Tzachi Rafaeli , Alex Tokar , David Berman , Moshe Beylin
- 申请人: Isaac Mazor , Alex Dikopoltsev , Boris Yokhin , Dileep Agnihotri , Tzachi Rafaeli , Alex Tokar , David Berman , Moshe Beylin
- 申请人地址: IL Migdal Ha'emek
- 专利权人: JORDAN VALLEY SEMICONDUCTORS LTD.
- 当前专利权人: JORDAN VALLEY SEMICONDUCTORS LTD.
- 当前专利权人地址: IL Migdal Ha'emek
- 主分类号: G01N23/201
- IPC分类号: G01N23/201 ; H01L21/02 ; B05C11/00
摘要:
A computer-implemented method for inspection of a sample includes defining a plurality of locations on a surface of the sample, irradiating the surface at each of the locations with a beam of X-rays, and measuring an angular distribution of the X-rays that are emitted from the surface responsively to the beam, so as to produce a respective plurality of X-ray spectra. The X-ray spectra are analyzed to produce respective figures-of-merit indicative of a measurement quality of the X-ray spectra at the respective locations. One or more locations are selected out of the plurality of locations responsively to the figures-of-merit, and a property of the sample is estimated using the X-ray spectra measured at the selected locations.
公开/授权文献
信息查询