发明申请
- 专利标题： Embedded Strip Lot Autocalibration
- 专利标题（中）： 嵌入式带批量自动校准
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申请号： US12115770申请日： 2008-05-06
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公开(公告)号： US20090134024A1公开(公告)日： 2009-05-28
- 发明人: Gary T. Neel , Brent E. Modzelewski , Allan Javier Caban , Adam Mark Will , Carlos Oti
- 申请人： Gary T. Neel , Brent E. Modzelewski , Allan Javier Caban , Adam Mark Will , Carlos Oti
- 主分类号： G01N27/26
- IPC分类号： G01N27/26 ; B05D5/12 ; H01R43/00
摘要：
An auto-calibration system for diagnostic test strips is described for presenting data individually carried on each test strip readable by a diagnostic meter. The test strip meter may provide a predetermined varying resistance on one strip or a plurality of varying resistances from strip lot to strip lot.
公开/授权文献
- US08999125B2 Embedded strip lot autocalibration 公开/授权日：2015-04-07
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