发明申请
- 专利标题: Charge control apparatus and measurement apparatus equipped with the charge control apparatus
- 专利标题(中): 装有充电控制装置的充电控制装置和测量装置
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申请号: US11338843申请日: 2006-01-25
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公开(公告)号: US20090166557A1公开(公告)日: 2009-07-02
- 发明人: Hiroshi Makino , Zhaohui Cheng , Kenji Tanimoto , Hideo Todokoro
- 申请人: Hiroshi Makino , Zhaohui Cheng , Kenji Tanimoto , Hideo Todokoro
- 优先权: JP2005-017596 20050126; JP2005-298311 20051013
- 主分类号: G21K5/10
- IPC分类号: G21K5/10 ; G01N23/00
摘要:
The invention solves charge nonuniformity of a specimen surface resulting from emission variation of a carbon nanotube electron source and individual difference of emission characteristics. During charge control processing, charge of the specimen surface is measured in real time. As means for solving charge nonuniformity resulting from nonuniformity of electron illumination density, electrons illuminating the specimen and the specimen are moved relatively to average electron illumination density. Moreover, an absorption current flowing into the specimen and the numbers of secondary electrons emitted from the specimen and of backscattered electrons are measured as means for monitoring charge of the specimen surface in real time.
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