发明申请
- 专利标题: FERROELECTRIC MEMORY DEVICE
- 专利标题(中): 电磁存储器件
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申请号: US12354990申请日: 2009-01-16
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公开(公告)号: US20090189152A1公开(公告)日: 2009-07-30
- 发明人: Byeong-Ok Cho , Moon-Sook Lee , Man-Hyoung Ryoo , Jung-Hyeon Kim , Takahiro Yasue
- 申请人: Byeong-Ok Cho , Moon-Sook Lee , Man-Hyoung Ryoo , Jung-Hyeon Kim , Takahiro Yasue
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2008-0004954 20080116
- 主分类号: H01L51/00
- IPC分类号: H01L51/00 ; H01L29/76
摘要:
Provided is a ferroelectric memory device. The ferroelectric memory device includes an inorganic channel pattern on a substrate, a source electrode and a drain electrode spaced apart from each other on the substrate and contacting the inorganic channel pattern, a gate electrode disposed adjacent to the inorganic channel pattern, and an organic ferroelectric layer interposed between the inorganic channel pattern and the gate electrode.
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