发明申请
US20090201502A1 Metrology system with spectroscopic ellipsometer and photoacoustic measurements 有权
光谱椭偏仪和光声测量的计量系统

Metrology system with spectroscopic ellipsometer and photoacoustic measurements
摘要:
An optical system includes both a microspot broadband spectroscopic ellipsometer and a photoacoustic film thickness measurement system that are supplied laser light by the same laser light source. One of the systems makes a measurement, the result of which is used to adjust a parameter of the other system; e.g. the ellipsometer measures thickness and the photoacoustic system uses the thickness result to measure the speed of sound. In one version, the ellipsometer converts the laser beam to a broad-spectrum beam that provides higher intensity.
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