发明申请
- 专利标题: Metrology system with spectroscopic ellipsometer and photoacoustic measurements
- 专利标题(中): 光谱椭偏仪和光声测量的计量系统
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申请号: US12381477申请日: 2009-03-11
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公开(公告)号: US20090201502A1公开(公告)日: 2009-08-13
- 发明人: Robert Gregory Wolf , Christopher Morath , Robin Mair
- 申请人: Robert Gregory Wolf , Christopher Morath , Robin Mair
- 主分类号: G01N21/00
- IPC分类号: G01N21/00 ; G01B11/06
摘要:
An optical system includes both a microspot broadband spectroscopic ellipsometer and a photoacoustic film thickness measurement system that are supplied laser light by the same laser light source. One of the systems makes a measurement, the result of which is used to adjust a parameter of the other system; e.g. the ellipsometer measures thickness and the photoacoustic system uses the thickness result to measure the speed of sound. In one version, the ellipsometer converts the laser beam to a broad-spectrum beam that provides higher intensity.
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