发明申请
- 专利标题： METHOD AND APPARATUS FOR IMPROVING RANDOM PATTERN TESTING OF LOGIC STRUCTURES
- 专利标题（中）： 改进逻辑结构随机模式测试的方法和装置
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申请号： US12051744申请日： 2008-03-19
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公开(公告)号： US20090240995A1公开(公告)日： 2009-09-24
- 发明人: Mary P. Kusko , Barry W. Krumm , Patrick Meaney , Bryan J. Robbins
- 申请人： Mary P. Kusko , Barry W. Krumm , Patrick Meaney , Bryan J. Robbins
- 申请人地址： US NY Armonk
- 专利权人： INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人： INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址： US NY Armonk
- 主分类号： G01R31/3177
- IPC分类号： G01R31/3177 ; G06F11/25
摘要：
A test method and apparatus for randomly testing logic structures. The method includes identifying and analyzing a functional behavior of a logic structure to be covered during the random testing, modifying the logic structure such that the logic structure behaves in a functional manner during random testing, and generating patterns to exercise the modified logic structure.
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