摘要:
A test method and apparatus for randomly testing logic structures. The method includes identifying and analyzing a functional behavior of a logic structure to be covered during the random testing, modifying the logic structure such that the logic structure behaves in a functional manner during random testing, and generating patterns to exercise the modified logic structure.
摘要:
A test method and apparatus for randomly testing logic structures. The method includes identifying and analyzing a functional behavior of a logic structure to be covered during the random testing, modifying the logic structure such that the logic structure behaves in a functional manner during random testing, and generating patterns to exercise the modified logic structure.
摘要:
A partitioned pseudo-random logic test (PRLT) for integrated circuit chips for improving manufacturability is disclosed. The technique makes available previously difficult-to-collect empirical data to accurately improve test effectiveness while significantly lowering test time and test cost. An embodiment includes a method for testing IC chips, including generating values for latches for a complete test pattern set, partitioning the test pattern set into a plurality of partitioned test pattern subsets, and running the subsets against a chip. Another embodiment is directed to a system that tests IC chips, having a latch value generator that generates values for latches for a complete test pattern set, a test pattern divider that partitions the complete test pattern set into a plurality of partitioned test pattern subsets, and a tester that runs the partitioned test pattern subsets against the chip.
摘要:
An exemplary embodiment of the invention is a built-in self-test (BIST) method and apparatus for testing the logic circuits on an integrated circuit. Random test pattern data is generated by a random pattern generator. A random resistant fault analysis (RRFA) program is used to determine the weighting requirements, on a per channel basis, for testing the logic circuits. The weighting requirements from the RRFA program are applied to the random test pattern data resulting in weighted test pattern data. The weighted test pattern data is then programmably applied to the scan chain.
摘要:
A method for preparing a logic structure for random pattern testing is disclosed. In an exemplary embodiment of the invention, the method includes configuring a select mechanism within a data scan chain, the select mechanism configured between a first register in the data scan chain and a second register. A parallel data path is routed within the scan chain, the parallel data path beginning from an input side of the first register, running through the select mechanism, and ending at an input side of the second register. Thus configured, the select mechanism is capable of switching a source path of input data to said second register from a normal data path to the parallel data path. When the parallel data path is selected as the source path of input data to the second register, data loaded into the second register matches data loaded into the first register.
摘要:
A method comprises generating a first behavioral model of a circuit describing a physical circuit in a first configuration. The first configuration comprises a first master latch, a first fanout path, and a logic cone. The first master latch couples to the first fanout path and is configured to receive a first data input signal. The first fanout path comprises a plurality of output sinks, each coupled to the logic cone. The first behavioral model is modified to generate a second behavioral model describing the physical circuit in a second configuration. The second configuration comprises an error circuit and an abstract latch clone based on the first master latch. A configuration file is generated based on the second behavioral model. The configuration file comprises information representing a plurality of instantiated latch clones based on the abstract latch clone, each configured to couple to the first data input signal and to one or more output sinks of the plurality of output sinks. The second behavioral model and the configuration file are together configured for input to a synthesis tool.
摘要:
A method comprises generating a first behavioral model of a circuit describing a physical circuit in a first configuration. The first configuration comprises a first master latch, a first fanout path, and a logic cone. The first master latch couples to the first fanout path and is configured to receive a first data input signal. The first fanout path comprises a plurality of output sinks, each coupled to the logic cone. The first behavioral model is modified to generate a second behavioral model describing the physical circuit in a second configuration. The second configuration comprises an error circuit and an abstract latch clone based on the first master latch. A configuration file is generated based on the second behavioral model. The configuration file comprises information representing a plurality of instantiated latch clones based on the abstract latch clone, each configured to couple to the first data input signal and to one or more output sinks of the plurality of output sinks. The second behavioral model and the configuration file are together configured for input to a synthesis tool.
摘要:
A method for performing a logical built-in self-test of an integrated circuit is disclosed. The method includes performing a flush and scan test to determine whether the scan chains function correctly. If one of the scan chains does not function correctly, the logical built-in self-test is terminated. If each of the scan chains functions correctly, a structural test of the design-for-test logic supporting LBIST is performed to determine whether the LBIST design-for-test logic functions correctly. If the LBIST design-for-test logic does not function correctly, the logical built-in self-test is terminated. If the LBIST design-for-test logic functions correctly, a level sensitive scan design test of the functional combinational logic is performed using the logic supporting LBIST design-for-test to determine if the integrated circuit functions correctly.
摘要:
A method includes generating a first behavioral model of a circuit, the first behavioral model describing a physical circuit in a first configuration. The first configuration comprises a first logic structure configured to generate a first intermediate signal based on a received first plurality of inputs. The first configuration further comprises a logic cone configured to generate a scan output based on the first intermediate signal and a plurality of scan inputs. The first behavioral model is modified to generate a second behavioral model describing the physical circuit in a second configuration. The second configuration comprises an error circuit configured to receive the scan output and the first intermediate signal. A testability model is generated based on the second behavioral model, the testability model comprising a first structural representation of the first logic structure. In the event the first logic structure causes a coverage problem, the testability model is modified to include an inversion structure. The inversion structure is configured based on the first logic structure. The inversion structure is configured to generate an inversion structure output. The testability model is modified to couple the inversion structure output as an input to the error circuit.
摘要:
Methods and systems for reducing the volume of test data associated with built in self testing (BIST) test methodologies (e.g., logical BIST, array BIST, etc.) and pattern structures are provided. Embodiments of the present invention store a limited number of “dynamic” test parameters for each test sequence that have changed relative to a previous test sequence.