A transistor with crystalline semiconductor stripes and an associated fabrication process are provided. The method provides a substrate, and deposits a semiconductor layer overlying the substrate. The semiconductor layer is irradiated using a scanning step-and-repeat laser annealing process, which agglomerates portions of the semiconductor layer. In response to cooling agglomerated semiconductor material, a transistor active semiconductor region is formed including a plurality of crystalline semiconductor stripes oriented along parallel axes. In one aspect, a channel region is formed from the plurality of oriented crystalline semiconductor stripes, and the method forms a gate dielectric overlying the channel region, with a gate electrode overlying the gate dielectric. In another aspect, forming the transistor active semiconductor region includes forming source, drain, and channel regions from the plurality of oriented crystalline semiconductor stripes.