发明申请
- 专利标题: LATERAL METAL OXIDE SEMICONDUCTOR DRAIN EXTENSION DESIGN
- 专利标题(中): 侧向金属氧化物半导体漏斗扩展设计
-
申请号: US12101608申请日: 2008-04-11
-
公开(公告)号: US20090256199A1公开(公告)日: 2009-10-15
- 发明人: Marie Denison , Seetharaman Sridhar , Sameer Pendharkar
- 申请人: Marie Denison , Seetharaman Sridhar , Sameer Pendharkar
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 主分类号: H01L29/00
- IPC分类号: H01L29/00 ; H01L21/336
摘要:
A semiconductor device comprising source and drain regions and insulating region and a plate structure. The source and drain regions are on or in a semiconductor substrate. The insulating region is on or in the semiconductor substrate and located between the source and drain regions. The insulating region has a thin layer and a thick layer. The thick layer includes a plurality of insulating stripes that are separated from each other and that extend across a length between the source and the drain regions. The plate structure is located between the source and the drain regions, wherein the plate structure is located on the thin layer and portions of the thick layer, the plate structure having one or more conductive bands that are directly over individual ones of the plurality of insulating stripes.
公开/授权文献
- US07847351B2 Lateral metal oxide semiconductor drain extension design 公开/授权日:2010-12-07
信息查询
IPC分类: