发明申请
US20090286076A1 Material to be measured for stress analysis, coating liquid for forming coating film layer on the material to be measured, and stress-induced luminescent structure
审中-公开
要测量的材料用于应力分析，用于在待测材料上形成涂膜层的涂布液和应力诱导的发光结构
- 专利标题： Material to be measured for stress analysis, coating liquid for forming coating film layer on the material to be measured, and stress-induced luminescent structure
- 专利标题（中）： 要测量的材料用于应力分析，用于在待测材料上形成涂膜层的涂布液和应力诱导的发光结构
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申请号： US11989598申请日： 2006-08-02
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公开(公告)号： US20090286076A1公开(公告)日： 2009-11-19
- 发明人: Chao-Nan Xu , Yusuke Imai , Nao Terasaki , Yoshio Adachi , Hiroshi Yamada , Keiko Nishikubo
- 申请人： Chao-Nan Xu , Yusuke Imai , Nao Terasaki , Yoshio Adachi , Hiroshi Yamada , Keiko Nishikubo
- 优先权： JP2005-226022 20050803
- 国际申请： PCT/JP2006/315335 WO 20060802
- 主分类号： C09K11/08
- IPC分类号： C09K11/08 ; B32B27/00
摘要：
In one embodiment of the present invention, on the surface of a material to be measured for stress analysis which has a stress-induced luminescent material layer formed thereon, a distortion energy is disclosed which is transmitted from a base material of a stress-induced luminescent material to the stress-induced luminescent material with high efficiency. The material to be measured for stress analysis has, on the surface thereof, a coating film layer, which emits light upon exposure to a change in distortion energy. The coating film layer is formed of a synthetic resin layer containing stress-induced luminescent particles, and the modulus of elasticity of a base material is not less than 1.0 GPa. The thickness of the coating film layer is preferably 1 μm to 500 μm.
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