发明申请
- 专利标题: Self-Calibrating Modulator Apparatuses and Methods
- 专利标题(中): 自校准调制器装置及方法
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申请号: US12131417申请日: 2008-06-02
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公开(公告)号: US20090295493A1公开(公告)日: 2009-12-03
- 发明人: Wayne S. Lee , Akira Kato , Toru Matsuura
- 申请人: Wayne S. Lee , Akira Kato , Toru Matsuura
- 专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.
- 主分类号: H03C3/00
- IPC分类号: H03C3/00 ; G01R23/00
摘要:
A self-calibrating modulator apparatus includes a modulator having a controlled oscillator and an oscillator gain calibration circuit. The oscillator gain calibration circuit includes an oscillator gain coefficient calculator configured to calculate a plurality of frequency dependent oscillator gain coefficients from results of measurements taken at the output of the controlled oscillator in response to a test pattern signal representing a plurality of different reference frequencies. The plurality of frequency dependent gain coefficients determined from the calibration process are stored in a look up table (LUT), where they are made available after the calibration process ends to scale a modulation signal applied to the modulator. By scaling the modulation signal prior to it being applied to the control input of the controlled oscillator, the nonlinear response of the controlled oscillator is countered and the modulation accuracy of the modulator is thereby improved.
公开/授权文献
- US07746187B2 Self-calibrating modulator apparatuses and methods 公开/授权日:2010-06-29