Invention Application
- Patent Title: Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspection Method
- Patent Title (中): 试样支架,试样检测装置和试样检验方法
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Application No.: US12478111Application Date: 2009-06-04
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Publication No.: US20090314955A1Publication Date: 2009-12-24
- Inventor: Hidetoshi Nishiyama , Mitsuru Koizumi , Mitsuo Suga
- Applicant: Hidetoshi Nishiyama , Mitsuru Koizumi , Mitsuo Suga
- Applicant Address: JP Tokyo
- Assignee: JEOL LTD.
- Current Assignee: JEOL LTD.
- Current Assignee Address: JP Tokyo
- Priority: JP2008-161476 20080620
- Main IPC: G21K5/10
- IPC: G21K5/10 ; G01N23/00

Abstract:
A specimen holder is offered which can reduce the amount of chemical sprayed over a specimen consisting of cultured cells. The specimen holder has an open specimen-holding surface. At least a part of the specimen-holding surface is formed by a film and a tapering portion formed around the film. The specimen can be cultured on the specimen-holding surface of the film. The presence of the tapering portion can reduce the amount of used reagent. The specimen can be irradiated via the film with a primary beam for observation or inspection of the specimen. Consequently, the specimen, such as cells, can be well observed or inspected in vivo while the specimen is being cultured. Especially, if an electron beam is used as the primary beam, the specimen can be well observed or inspected in vivo by SEM (scanning electron microscopy).
Public/Granted literature
- US08030622B2 Specimen holder, specimen inspection apparatus, and specimen inspection method Public/Granted day:2011-10-04
Information query