发明申请
- 专利标题: EPITAXIAL SEMICONDUCTOR DEPOSITION METHODS AND STRUCTURES
- 专利标题(中): 外延半导体沉积方法和结构
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申请号: US12556377申请日: 2009-09-09
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公开(公告)号: US20100006024A1公开(公告)日: 2010-01-14
- 发明人: Paul D. Brabant , Joseph P. Italiano , Chantal J. Arena , Pierre Tomasini , Ivo Raaijmakers , Matthias Bauer
- 申请人: Paul D. Brabant , Joseph P. Italiano , Chantal J. Arena , Pierre Tomasini , Ivo Raaijmakers , Matthias Bauer
- 申请人地址: US AZ Phoenix
- 专利权人: ASM AMERICA, INC.
- 当前专利权人: ASM AMERICA, INC.
- 当前专利权人地址: US AZ Phoenix
- 主分类号: C30B23/04
- IPC分类号: C30B23/04
摘要:
Methods for depositing epitaxial films such as epitaxial Ge and SiGe films. During cooling from high temperature processing to lower deposition temperatures for Ge-containing layers, Si or Ge compounds are provided to the substrate. Smooth, thin, relatively defect-free Ge or SiGe layers result. Retrograded relaxed SiGe is also provided between a relaxed, high Ge-content seed layer and an overlying strained layer.
公开/授权文献
- US08530340B2 Epitaxial semiconductor deposition methods and structures 公开/授权日:2013-09-10
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