Invention Application
- Patent Title: Infrared Defect Detection System and Method for the Evaluation of Powdermetallic Compacts
- Patent Title (中): 红外线缺陷检测系统及其评价方法
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Application No.: US12304520Application Date: 2007-06-18
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Publication No.: US20100033565A1Publication Date: 2010-02-11
- Inventor: Souheil Benzerrouk , Reinhold Ludwig , Diran Apelian
- Applicant: Souheil Benzerrouk , Reinhold Ludwig , Diran Apelian
- Applicant Address: US MA Worcester
- Assignee: WORCESTER POLYTECHNIC INSTITUTE
- Current Assignee: WORCESTER POLYTECHNIC INSTITUTE
- Current Assignee Address: US MA Worcester
- International Application: PCT/US07/71451 WO 20070618
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H04N7/18 ; H04N5/33 ; G01N21/00
Abstract:
A pulsed thermography defect detection apparatus including active and passive infrared (IR) thermography for non-destructive testing (NDT) of powdermetallic (P/M) components for on-line and off-line inspection.
Public/Granted literature
- US08581975B2 Infrared defect detection system and method for the evaluation of powdermetallic compacts Public/Granted day:2013-11-12
Information query
