发明申请
- 专利标题: MANUFACTURING METHOD FOR PROBE CONTACT
- 专利标题(中): 探针接触的制造方法
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申请号: US12516155申请日: 2008-09-02
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公开(公告)号: US20100050431A1公开(公告)日: 2010-03-04
- 发明人: Takeyuki Suzuki , Ryo Ujike , Yoshinori Wakabayashi
- 申请人: Takeyuki Suzuki , Ryo Ujike , Yoshinori Wakabayashi
- 申请人地址: JP Tokyo
- 专利权人: YAMAICHI ELECTRONICS CO., LTD.
- 当前专利权人: YAMAICHI ELECTRONICS CO., LTD.
- 当前专利权人地址: JP Tokyo
- 优先权: JP2007-234091 20070910
- 国际申请: PCT/JP2008/002396 WO 20080902
- 主分类号: H01R43/16
- IPC分类号: H01R43/16
摘要:
To make the fracturing position controlled conveniently with high precision when the substrate end of the probe contact is fractured and cut off.By compressing the front face of the substrate end portion with the pushing member, brittle fracture is generated on the substrate along the carved groove, and the substrate end portion is cut off from the substrate. The fracturing position in the above-mentioned fracturing is controlled so as to be along the fracturing position whose extension puts thereon the stress concentrating ends of two fracturing control structures. Here, the fracturing control structure is located with high positional precision on the front face of the substrate through the alignment technique of photolithography. In this way, resilient armatures constituted of the tips projected from the fracturing position coming to be the end of the substrate 11a can be stably formed with high precision.
公开/授权文献
- US08312626B2 Manufacturing method for probe contact 公开/授权日:2012-11-20