发明申请
- 专利标题: CENTRAL PROCESSING UNIT MEASUREMENT FACILITY
- 专利标题(中): 中央处理单元测量设备
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申请号: US12244300申请日: 2008-10-02
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公开(公告)号: US20100088444A1公开(公告)日: 2010-04-08
- 发明人: Jane H. Bartik , Lisa Cranton Heller , Damian L. Osisek , Donald W. Schmidt , Patrick M. West, JR. , Phil C. Yeh
- 申请人: Jane H. Bartik , Lisa Cranton Heller , Damian L. Osisek , Donald W. Schmidt , Patrick M. West, JR. , Phil C. Yeh
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F13/24
- IPC分类号: G06F13/24
摘要:
A measurement sampling facility takes snapshots of the central processing unit (CPU) on which it is executing at specified sampling intervals to collect data relating to tasks executing on the CPU. The collected data is stored in a buffer, and at selected times, an interrupt is provided to remove data from the buffer to enable reuse thereof. The interrupt is not taken after each sample, but in sufficient time to remove the data and minimize data loss.
公开/授权文献
- US07827321B2 Central processing unit measurement facility 公开/授权日:2010-11-02
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