发明申请
US20100109699A1 METHODS, APPARATUS AND ARTICLES OF MANUFACTURE FOR TESTING A PLURALITY OF SINGULATED DIE
有权
方法，装置和制造用于测试多重复合DIE的制造方法
- 专利标题： METHODS, APPARATUS AND ARTICLES OF MANUFACTURE FOR TESTING A PLURALITY OF SINGULATED DIE
- 专利标题（中）： 方法，装置和制造用于测试多重复合DIE的制造方法
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申请号： US12549049申请日： 2009-08-27
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公开(公告)号： US20100109699A1公开(公告)日： 2010-05-06
- 发明人: James C. Anderson , Alan D. Hart , Kenneth D. Karklin
- 申请人： James C. Anderson , Alan D. Hart , Kenneth D. Karklin
- 主分类号： G01R31/26
- IPC分类号： G01R31/26
摘要：
In one embodiment, a method for testing a plurality of singulated semiconductor die involves 1) placing each of the singulated semiconductor die on a surface of a die carrier, 2) mating an array of electrical contactors with the plurality of singulated semiconductor die, and then 3) performing electrical tests on the plurality of singulated semiconductor die, via the array of electrical contactors.
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