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公开(公告)号：US4917476A
公开(公告)日：1990-04-17
申请号：US168557
申请日：1988-03-04
摘要： It is known to use liquid crystal cells for thermal imaging. However, the sensitivity of the liquid crystal cell is reduced due to the walls of the cell absorbing some of the incident radiation and locally heating the crystal thereby producing localized changes in phase. Liquid crystal materials which have sufficient surface tension to form a film without forming a part of a cell are disclosed where the pitch of the helix of the film exhibits a strong temperature dependence. In one embodiment the liquid crystal film is mounted wtihin a Fabry-Perot resonant cavity so that detection of the change in the crystal due to a change in temperature is enhanced.
摘要翻译： 已知使用液晶单元进行热成像。 然而，由于电池的壁吸收了一些入射的辐射并且局部地加热了晶体，所以液晶单元的灵敏度降低，从而产生相位的局部变化。 公开了具有足够的表面张力以形成膜而不形成电池的一部分的液晶材料，其中膜的螺旋的螺距具有强烈的温度依赖性。 在一个实施例中，液晶膜由Fabry-Perot谐振腔安装，从而提高了由于温度变化引起的晶体变化的检测。
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公开(公告)号：US07262620B2
公开(公告)日：2007-08-28
申请号：US11264577
申请日：2005-10-31
申请人： Edmundo de la Puente , Alan D. Hart
发明人： Edmundo de la Puente , Alan D. Hart
CPC分类号： G01R31/31926 , G11C29/56 , G11C2029/5602
摘要： In one embodiment, a resource matrix is provided with a first set of pins, a second set of pins, and at least one programmable switching circuit. The first set of pins electrically couples the resource matrix with a tester resource. The second set of pins electrically couples the resource matrix with a plurality of test areas. The at least one programmable switching circuit selectively couples each one of the first set of pins to different ones of the second set of pins. In one embodiment, the at least one programmable switching circuit includes a set of multiplexers. In another embodiment, the at least one programmable switching circuit includes a set of LIMMS. In another embodiment, a system is disclosed for testing a plurality of test areas with a tester resource and a resource matrix. Methods for routing signals between a tester resource and plurality of test areas are also disclosed.
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3.发明申请METHODS, APPARATUS AND ARTICLES OF MANUFACTURE FOR TESTING A PLURALITY OF SINGULATED DIE 有权方法，装置和制造用于测试多重复合DIE的制造方法公开(公告)号：US20100109699A1
公开(公告)日：2010-05-06
申请号：US12549049
申请日：2009-08-27
IPC分类号： G01R31/26
CPC分类号： H01L22/20 , G01R31/2891
摘要： In one embodiment, a method for testing a plurality of singulated semiconductor die involves 1) placing each of the singulated semiconductor die on a surface of a die carrier, 2) mating an array of electrical contactors with the plurality of singulated semiconductor die, and then 3) performing electrical tests on the plurality of singulated semiconductor die, via the array of electrical contactors.
摘要翻译： 在一个实施例中，一种用于测试多个单片半导体管芯的方法包括：1）将每个单片化半导体管芯放置在管芯载体的表面上，2）将电接触器阵列与多个单片化半导体管芯配合，然后 3）经由电接触器阵列对多个单片半导体管芯进行电测试。
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公开(公告)号：US4769527A
公开(公告)日：1988-09-06
申请号：US903454
申请日：1986-09-04
申请人： Alan D. Hart , Alan P. Pritchard
发明人： Alan D. Hart , Alan P. Pritchard
IPC分类号： B41J2/355 , F41J2/02 , G01R31/302 , H05B1/00
CPC分类号： B41J2/355 , F41J2/02 , G01R31/302
摘要： A thermal image producing device comprising an array of separately addressable thin-film resistors on a substrate with a heat sink at its near face and, so as to render the heat flux flowing through the substrate into the heat sink spatially and temporarily uniform, e.g. to avoid smearing, an array of compensating resistors, each beneath a respective one of the image producing resistors and separated therefrom by an insulating layer. Each compensating resistor is controlled so that, it and its associated image producing resistor together, produce a uniform total heat flux.
摘要翻译： 一种热图像产生装置，包括在其近侧具有散热器的基板上的独立可寻址的薄膜电阻器的阵列，并且使得热通量在空间上暂时均匀地流过衬底进入散热器，例如， 以避免涂抹一组补偿电阻器，每个补偿电阻器各自位于图像产生电阻器的相应一个下方，并通过绝缘层与其分离。 控制每个补偿电阻器，使其及其相关联的图像产生电阻器一起产生均匀的总热通量。
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5.发明授权Methods, apparatus and articles of manufacture for testing a plurality of singulated die 有权用于测试多个单个模具的方法，装置和制品公开(公告)号：US08884639B2
公开(公告)日：2014-11-11
申请号：US12549049
申请日：2009-08-27
CPC分类号： H01L22/20 , G01R31/2891
摘要： In one embodiment, a method for testing a plurality of singulated semiconductor die involves 1) placing each of the singulated semiconductor die on a surface of a die carrier, 2) mating an array of electrical contactors with the plurality of singulated semiconductor die, and then 3) performing electrical tests on the plurality of singulated semiconductor die, via the array of electrical contactors.
摘要翻译： 在一个实施例中，一种用于测试多个单片半导体管芯的方法包括：1）将每个单片化半导体管芯放置在管芯载体的表面上，2）将电接触器阵列与多个单片化半导体管芯配合，然后 3）经由电接触器阵列对多个单片半导体管芯进行电测试。
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公开(公告)号：US5468446A
公开(公告)日：1995-11-21
申请号：US202464
申请日：1994-02-28
申请人： Peter C. Morgan , Alan D. Hart , Philip D. Morgans
发明人： Peter C. Morgan , Alan D. Hart , Philip D. Morgans
CPC分类号： B01J2/003
摘要： The pelletisation or granulation of a material or mixture of materials the or at least one of which is reactive in a liquid to produce a gas is improved by treating the reactive material prior to final compaction to form a coating thereon of a substance which is less soluble in the liquid than the reactive material. The preferred reactive material is calcium hydride and the preferred coating is calcium carbonate with or without calcium hydroxide.
摘要翻译： 通过在最终压实之前处理反应性材料以在液体中反应以产生气体的材料或其至少一种在材料中的材料或混合物的造粒或造粒，以在其上形成较不溶解的物质的涂层 在液体中比反应物质。 优选的反应性材料是氢化钙，优选的涂层是具有或不具有氢氧化钙的碳酸钙。
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公开(公告)号：US20080252330A1
公开(公告)日：2008-10-16
申请号：US11735871
申请日：2007-04-16
申请人： Alan D. Hart , Erik Volkerink , Gayn Erickson
发明人： Alan D. Hart , Erik Volkerink , Gayn Erickson
IPC分类号： G01R31/26
CPC分类号： H01L22/20 , H01L21/78 , H01L2924/0002 , H01L2924/00
摘要： In accordance with one embodiment of the invention, a method of singulated die testing can be implemented. This can be implemented by obtaining a wafer and singulating the dies into individual die pieces. The singulated dies can be arranged in a separated testing arrangement and can even combine dies from multiple wafers as part of the combined arrangement. Then, testing can be implemented on the combined test arrangement.
摘要翻译： 根据本发明的一个实施例，可以实现单模裸片测试的方法。 这可以通过获得晶片并将模具分离成单独的模具来实现。 单个模具可以以分离的测试装置布置，并且甚至可以将来自多个晶片的模具组合为组合布置的一部分。 然后，可以在组合的测试装置上实施测试。
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