发明申请
US20100182034A1 CIRCUIT FOR CONTINUOUSLY MEASURING DISCONTINUOUS METAL INSULATOR TRANSITION OF MIT ELEMENT AND MIT SENSOR USING THE SAME
有权
用于连续测量不连续金属绝缘子过渡的电路元件和麻省传感器的电路
- 专利标题： CIRCUIT FOR CONTINUOUSLY MEASURING DISCONTINUOUS METAL INSULATOR TRANSITION OF MIT ELEMENT AND MIT SENSOR USING THE SAME
- 专利标题（中）： 用于连续测量不连续金属绝缘子过渡的电路元件和麻省传感器的电路
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申请号： US12376668申请日： 2007-07-05
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公开(公告)号： US20100182034A1公开(公告)日： 2010-07-22
- 发明人: Hyun-Tak Kim , Bong-Jun Kim , Yong-Wook Lee , Sun-Jin Yun , Sang-Kuk Choi
- 申请人： Hyun-Tak Kim , Bong-Jun Kim , Yong-Wook Lee , Sun-Jin Yun , Sang-Kuk Choi
- 申请人地址： KR Daejeon-City
- 专利权人： Electronics and Telecommunications Research Institute
- 当前专利权人： Electronics and Telecommunications Research Institute
- 当前专利权人地址： KR Daejeon-City
- 优先权： KR10-2006-0074310 20060807; KR10-2006012928 20061215
- 国际申请： PCT/KR07/03268 WO 20070705
- 主分类号： G01R31/26
- IPC分类号： G01R31/26
摘要：
Provided are a circuit for continuously measuring a discontinuous metal-insulator transition (MIT) of an MIT element and an MIT sensor using the circuit. The circuit comprises a to-be-measured object unit including the MIT element having a discontinuous MIT occurring at the transition voltage thereof, a power supply unit applying a predetermined pulse current or voltage signal to the to-be-measured object unit, a measurement unit measuring the discontinuous MIT of the MIT element, and a microprocessor controlling the power supply unit and the measurement unit. The discontinuous MIT measurement circuit continuously measures the discontinuous MIT of the MIT element, and thus it can be used as a sensor for sensing a variation in an external factor.
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