发明申请
- 专利标题: Thin Film of Aluminum Nitride and Process for Producing the Thin Film of Aluminum Nitride
- 专利标题(中): 氮化铝薄膜和生产氮化铝薄膜的方法
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申请号: US12602104申请日: 2009-02-18
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公开(公告)号: US20100209622A1公开(公告)日: 2010-08-19
- 发明人: Issei Satoh , Naho Mizuhara , Keisuke Tanizaki , Michimasa Miyanaga , Takashi Sakurada , Yoshiyuki Yamamoto , Hideaki Nakahata
- 申请人: Issei Satoh , Naho Mizuhara , Keisuke Tanizaki , Michimasa Miyanaga , Takashi Sakurada , Yoshiyuki Yamamoto , Hideaki Nakahata
- 申请人地址: JP Osaka-shi
- 专利权人: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- 当前专利权人: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- 当前专利权人地址: JP Osaka-shi
- 优先权: JP2008-046335 20080227; JP2009-012038 20090122
- 国际申请: PCT/JP2009/052747 WO 20090218
- 主分类号: C23C16/34
- IPC分类号: C23C16/34 ; H05H1/24 ; C09D1/00
摘要:
Flat, thin AlN membranes and methods of their manufacture are made available.An AlN thin film (2) contains between 0.001 wt. % and 10 wt. % additive atomic element of one or more type selected from Group-III atoms, Group-IV atoms and Group-V atoms. Onto a base material (1), the AlN thin film (2) is formable utilizing a plasma generated by setting inside a vacuum chamber an sintered AlN ceramic containing between 0.001 wt. % and 10 wt. % additive atomic element of one or more type selected from Group-III atoms, Group-IV atoms and Group-V atoms, and with the base material having been set within the vacuum chamber, irradiating the sintered AlN ceramic with a laser.
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