发明申请
US20100239782A1 INSULATING FILM FORMING METHOD, INSULATING FILM FORMING APPARATUS, AND PLASMA FILM FORMING APPARATUS
审中-公开
绝缘膜成型方法,绝缘膜成型装置和等离子体膜成型装置
- 专利标题: INSULATING FILM FORMING METHOD, INSULATING FILM FORMING APPARATUS, AND PLASMA FILM FORMING APPARATUS
- 专利标题(中): 绝缘膜成型方法,绝缘膜成型装置和等离子体膜成型装置
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申请号: US12792226申请日: 2010-06-02
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公开(公告)号: US20100239782A1公开(公告)日: 2010-09-23
- 发明人: Atsushi SASAKI , Kazufumi Azuma , Tetsuya Ide , Yukihiko Nakata
- 申请人: Atsushi SASAKI , Kazufumi Azuma , Tetsuya Ide , Yukihiko Nakata
- 申请人地址: JP Yokohama-shi
- 专利权人: Advanced LCD Technologies Dev. Ctr., Co., Ltd
- 当前专利权人: Advanced LCD Technologies Dev. Ctr., Co., Ltd
- 当前专利权人地址: JP Yokohama-shi
- 优先权: JP2004-081307 20040319; JP2004-093199 20040326; JP2004-191804 20040629
- 主分类号: C23C16/513
- IPC分类号: C23C16/513
摘要:
An insulating film is formed with a plasma film forming apparatus which includes a vacuum vessel with an electromagnetic wave incident face F, first gas injection holes made in the vacuum vessel, and second gas injection holes made in the vacuum vessel farther away from the electromagnetic wave incident face F than the first gas injection holes. For example, a first gas is introduced from a position whose distance from the electromagnetic wave incident face F is less than 10 mm into the vacuum vessel. A second gas including an organic silicon compound is introduced from a position whose distance from the electromagnetic wave incident face is 10 mm or more into the vacuum vessel.
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