发明申请
- 专利标题: METHOD FOR MAKING A STRESSED NON-VOLATILE MEMORY DEVICE
- 专利标题(中): 制造非易失性存储器件的方法
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申请号: US12414778申请日: 2009-03-31
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公开(公告)号: US20100248466A1公开(公告)日: 2010-09-30
- 发明人: Konstantin V. Loiko , Brian A. Winstead , Taras A. Kirichenko
- 申请人: Konstantin V. Loiko , Brian A. Winstead , Taras A. Kirichenko
- 主分类号: H01L21/28
- IPC分类号: H01L21/28
摘要:
A method of making a semiconductor device on a semiconductor layer includes: forming a gate dielectric over the semiconductor layer; forming a layer of gate material over the gate dielectric; etching the layer of gate material to form a select gate; forming a storage layer that extends over the select gate and over a portion of the semiconductor layer; depositing an amorphous silicon layer over the storage layer; etching the amorphous silicon layer to form a control gate; and annealing the semiconductor device to crystallize the amorphous silicon layer.
公开/授权文献
- US07960267B2 Method for making a stressed non-volatile memory device 公开/授权日:2011-06-14
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