发明申请
US20100248466A1 METHOD FOR MAKING A STRESSED NON-VOLATILE MEMORY DEVICE 有权
制造非易失性存储器件的方法

METHOD FOR MAKING A STRESSED NON-VOLATILE MEMORY DEVICE
摘要:
A method of making a semiconductor device on a semiconductor layer includes: forming a gate dielectric over the semiconductor layer; forming a layer of gate material over the gate dielectric; etching the layer of gate material to form a select gate; forming a storage layer that extends over the select gate and over a portion of the semiconductor layer; depositing an amorphous silicon layer over the storage layer; etching the amorphous silicon layer to form a control gate; and annealing the semiconductor device to crystallize the amorphous silicon layer.
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